Hosmer, David W.. <br/><br/>
Applid logistic regression /  
y David W. Hosmer & Stanley Lemeshow. 
 - 2nd ed /  
 - New York :   John Wiley & Sons, Inc. ,   2000 
 - 375p :  
<br/><br/><label>ISBN: </label>0-471-35632-8 
<br/><br/><label>Subjects--Topical Terms: </label><br/>Statistics
<br/><br/><label>Dewey Class. No.: </label>B  / P0