Bowen, W. Richard . Atomic force microscopy in process engineering: introduction to AFM for improved processes and products / by W Richard Bowen and Nidal Hilal. - Oxford : Elsevier Ltd. , 2009 - xvi, 283p ; ISBN: 978-1-85617-517-3 Subjects--Topical Terms: Engineering- Atomic forcce microscopy Dewey Class. No.: C(E:14) / P9