TY  - BOOK
AU  - Bowen, W. Richard  .
TI  - Atomic force microscopy in process engineering: introduction to AFM for improved processes and products / 
SN  - 978-1-85617-517-3
U1  - C(E:14) 
PY  - 2009///
CY  - Oxford : 
PB  - Elsevier Ltd. , 
KW  - Engineering- Atomic forcce microscopy
ER  -