000 00539nam a2200157Ia 4500
008 211115s9999 xx 000 0 und d
020 _a978-1-85617-517-3
041 _aeng
082 _aC(E:14)
_bP9
100 _aBowen, W. Richard .
245 0 _aAtomic force microscopy in process engineering: introduction to AFM for improved processes and products /
_cby W Richard Bowen and Nidal Hilal.
260 _aOxford :
_bElsevier Ltd. ,
_c2009
300 _axvi, 283p ;
650 _aEngineering- Atomic forcce microscopy
942 _cTB
999 _c67781
_d67781