Points Defects in Semiconductors II:Experimental Aspects /
Material type: TextLanguage: English Publication details: New York : Springer-Verlag , 1980Edition: 1st edDescription: xvi, 295pISBN: 3 540 11514 3Subject(s): Physics <Semiconductors>Colon classification: C4:24:f3Item type | Current library | Call number | Status | Date due | Barcode |
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Books | Central Library Manipur University | C4:24:f3 M3 (Browse shelf (Opens below)) | Available | 521/Phy |
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