Applid logistic regression / y David W. Hosmer & Stanley Lemeshow.

By: Hosmer, David WMaterial type: TextTextLanguage: English Publication details: New York : John Wiley & Sons, Inc. , 2000Edition: 2nd edDescription: 375pISBN: 0-471-35632-8Subject(s): StatisticsColon classification: B
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Item type Current library Call number Status Date due Barcode
Books Central Library Manipur University
B P0 (Browse shelf (Opens below)) Available 410/Sts

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