Atomic force microscopy in process engineering: introduction to AFM for improved processes and products / by W Richard Bowen and Nidal Hilal.
Material type: TextLanguage: English Publication details: Oxford : Elsevier Ltd. , 2009Description: xvi, 283pISBN: 978-1-85617-517-3Subject(s): Engineering- Atomic forcce microscopyColon classification: C(E:14)Item type | Current library | Call number | Status | Date due | Barcode |
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Text Books | Central Library Manipur University | C(E:14) P9 (Browse shelf (Opens below)) | Available | 4006/Phy |
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