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Statistical analysis of microstructures in materials science / by Joachim Ohser and Frank Mucklich.

By: Ohser, JoachimMaterial type: Text

TextLanguage: English Publication details: New York : John Wiley & Sons, Inc. , 2000Description: xxii, 381pISBN: 0-471-97486-2Subject(s): Stochastic geometryColon classification: B28

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Item type	Current library	Call number	Status	Date due	Barcode
Books	Central Library Manipur University	B28 P0 (Browse shelf (Opens below))	Available		1023/Stat

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