Physical principles of Electron microscopy: an introduction to TEM, SEM and AEM / by R.F. Egerton

By: Egerton, R.F [Author]Publication details: Switzerland: Springer, 2016Edition: 2nd edDescription: xi, 196pISBN: 9783319398761Colon classification: C9B5
Tags from this library: No tags from this library for this title. Log in to add tags.
    Average rating: 0.0 (0 votes)
Item type Current library Collection Call number Copy number Status Date due Barcode
Text Books Text Books Central Library Manipur University
Physics CM9 Q6 (Browse shelf (Opens below)) Available 4241/Phy
Books Central Library Manipur University
Textbook Section
General Book C9B5 Q6;1 (Browse shelf (Opens below)) 2 Not For Loan 4333/Phy

There are no comments on this title.

to post a comment.
Visitors