Multiple-beam interferometry of surfaces & films /

By: Tolansky, SMaterial type: TextTextLanguage: English Publication details: N.Y. 10014 : Dover Publications. Edition: 1st edDescription: p.184,xxISBN: 0-486-62215-0Subject(s): PhysicsColon classification: C9B60aB7,1
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Item type Current library Call number Status Date due Barcode
Books Central Library Manipur University
C9B60aB7,1 L0 (Browse shelf (Opens below)) Available 1430/Phy

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